Dec 9, 2019   7:01 p.m. Izabela
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Course syllabus EMM201_6I - Experimental Methods of Materials Analysis II (MTF - WS 2019/2020)


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University: Slovak University of Technology in Bratislava
Faculty: Faculty of Materials Science and Technology in Trnava
Course unit code: EMM201_6I
Course unit title: Experimental Methods of Materials Analysis II
Mode of completion and Number of ECTS credits: Exam (5 credits)
Course contents:
1.Introduction, Scanning Electron Microscopy (allowance 4/6)
 
a.Interaction of electrons with matter, the types of signals and their use
b.Construction of the scanning electron microscope, basic parameters
c.Modes of operation, image interpretation

2.Electron Backscattered Diffraction (EBSD) (allowance 2/4)
 
a.Diffraction conditions, Kikuchi lines
b.Principe of EBSD and interpretation of data
c.Practical applications in the materials science

3.Electron Energy Loss Spectroscopy (EELS) (allowance 2/1)
 
a.Elastic and inelastic scattering of electrons
b.Parallel and serial detector, spectrum interpretation
c.Practical applications in the materials science

4.Basic of electron microanalysis (allowance 2/0)
 
a.Generation of the characteristic x-ray radiation and its use for spectroscopy
b.Theoretical basics of electron microanalysis
c.Detection modes

5.Wave dispersive electron spectroscopy (WDS) (allowance 2/4)
 
a.Function of spectrometer and its basic characteristics
b.Analysing crystals, qualitative and quantitative analysis
c.Evaluation of the measured spectra and correction methods
d.Limiting conditions of use, accuracy and sensitivity of measurement

6.Energy dispersive spectroscopy (EDS) (allowance 2/4)
 
a.Function of spectrometer and its basic characteristics
b.Evaluating of the measured spectra, corrections, qualitative and quantitative analysis
c.Limiting conditions of use, accuracy and sensitivity of measurement

7.Auger electron spectroscopy (AES) (allowance 2/1)
 
a.Principle of the method, formation of Auger electron, energy criteria,
b.Experimental device, area of use, accuracy, limiting conditions,
c.Specification for the quality of the analysed samples, use for analysis of surface layers

8.X-ray fluorescent spectroscopy (XRF) (allowance 2/1)
 
a.Principle of XRF spectrometer operation
b.Analysing crystals, qualitative and quantitative analysis
c.Evaluation of the measured spectra, correction methods
d.Limiting conditions of use, accuracy and sensitivity of measurement

9.Optical emission spectroscopy (OES, GDOES) (allowance 2/2)
 
a.Theoretical analysis of optical emission spectroscopy
b.Principle of optical emission spectrometer operation
c.Methods of optical spectra detecting, interval concentrations measured,
d.Limiting conditions of use, accuracy and sensitivity of measurement

10.Mössbauer spectroscopy (allowance 2/1)
 
a.Principle of Mössbauer spectrometry, limiting conditions,
b.Experimental device, paramagnetic singlet, hyperfine splitting, isomer shift,
c.Types of spectra and their evaluation and interpretation, accuracy, sensitivity and resolution ability,

11.Secondary ion mass spectroscopy (SIMS) (allowance 2/1)
 
a.Ion interaction with matter
b.Type of mass spectrometers a description of their activities, the measurement of energy and angular distribution of secondary ions
c.Magnetic and quadrupole ion detectors, evaluation of spectra, limiting conditions, sensitivity of method

12.Other quantitative methods (allowance 2/1)
 
a.Quantitative measurement of carbon and sulphure
b.Quantitative measurement of hydrogen, oxygen and nitrogen


Last modification made by Bc. Jana Rohaľová on 12/20/2018.

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