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Course syllabus N418A6_4I - Analysis of the Structure of Solids and Their Surfaces and Thin Films (FCFT - WS 2019/2020)

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Slovak University of Technology in Bratislava
Course unit title:
Analysis of the Structure of Solids and Their Surfaces and Thin Films
Course unit code:
Mode of completion and Number of ECTS credits:
Classified fulfillment of requirements (2 credits)
Name of lecturer: Ing. František Čacho, PhD. (examiner, instructor, lecturer, tutor)
doc. Ing. Ľubomír Švorc, PhD. (person responsible for course)
Learning outcomes of the course unit:
Student receives knowledge of the principles and practical application of X-ray diffraction methods, and methods based on the interaction of matter with accelerated electrons for clarifying the structure and identification of inorganic and organic materials in the solid state.
Prerequisites and co-requisites:
Course contents:
1 Amorphous materials.
2 Liquid crystals.
3 Crystalline and polycrystalline materials.
4 X-ray structure analysis.
5 The interaction of matter with accelerated particles and high-energy photons.
6 Methods of surfaces and thin films.
7 X-ray fluorescence spectrometry (XRF).
8 X-ray photoelectron spectroscopy (XPS respectively. ESCA).
9 Auger electron spectroscopy (AES).
10 Electron microanalysis (microprobe).
11 RTG analysis of single crystal and polycrystalline materials.
Recommended or required reading:
KOŠINA, S. -- GARAJ, J. Vlastnosti a štruktúra tenkých vrstiev. Bratislava: VEDA, 1985.

GARAJ, J. -- BUSTIN, D. -- HLADKÝ, Z. Analytická chémia. Bratislava : Alfa, 1987. 740 p.

Planned learning activities and teaching methods: 1 hour. lecture / week,
1 hour. seminar / week

examination 3 credits
Assesment methods and criteria:
Written and oral examination
Language of instruction: Slovak, English
Work placement(s): There is no compulsory work placement in the course unit.

Last modification made by Ing. Tomáš Molnár on 07/16/2019.

Type of output: