Sylabus předmětu EMM201_6I - Experimental Methods of Materials Analysis II (MTF - WS 2019/2020)
Slovenština Angličtina
| University: | Slovak University of Technology in Bratislava | ||||||||||||
| Faculty: | Faculty of Materials Science and Technology in Trnava | ||||||||||||
| Course unit code: | EMM201_6I | ||||||||||||
| Course unit title: | Experimental Methods of Materials Analysis II | ||||||||||||
| Mode of delivery, planned learning activities and teaching methods: | |||||||||||||
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| Credits allocated: | 5 | ||||||||||||
| Recommended semester/trimester: | Materials Engineering - master (compulsory), 3. semester Materials Engineering - master (compulsory), 3. semester | ||||||||||||
| Level of study: | 1. + 2., 2. | ||||||||||||
| Prerequisites for registration: | none | ||||||||||||
| Assesment methods: | |||||||||||||
| During the semester there will be two written tests of knowledge in a lecture in the range of lectures and exercises with a maximum score of over 10 points. Students must develop four projects in laboratory exercises with the scores given to each of 10 points. Student who receives less than 15 points can not be granted credit. | |||||||||||||
| Learning outcomes of the course unit: | |||||||||||||
| The purpose of this class is to introduce students to the theoretical and practical aspects of experimental materials characterization by electron, x-ray and gamma radiation. A broad range of topics will be covered in order to give the exposure to all areas of materials science. In general, the class will introduce the experimental aspects of data and error analysis for virtually any technique. Students will be expected to understand the following concepts about each technique covered in class: scanning electron microscopy, Energy Dispersive Spectroscopy, Wave Dispersive Spectroscopy, Electron Backscattered Diffraction, Auger Electron Spectrosopy, Electron Energy Loss Spectroscopy, Optical Emission Spectroscopy, X-ray Fluorescent Spectroscopy, Secondary Ion Mass Spectroscopy and Mössbauer Spectroscopy. Evaluation of measured data will receive an overview of the possibilities of the application of these methods in the study of metallic and non-metallic materials. | |||||||||||||
| Course contents: | |||||||||||||
| Introduction to spectroscopy, Scanning Electron Microscopy, Interaction of electrons with matter, types of signals and their use, construction of the scanning electron microscope, basic parameters, modes of operation, image interpretation
Electron Backscattered Diffraction (EBSD), diffraction conditions, Kikuchi lines, principe of EBSD and interpretation of data, practical applications in the materials science Electron Energy Loss Spectroscopy (EELS), elastic and inelastic scattering of electrons, parallel and serial detector, spectrum interpretation, practical applications in the materials science Basic of electron microanalysis, generation of the characteristic x-ray radiation and its use for spectroscopy, theoretical basics of electron microanalysis, detection modes Wave dispersive electron spectroscopy (WDS), function of spectrometer and its basic characteristics, analysing crystals, qualitative and quantitative analysis, evaluation of the measured spectra and correction methods, limiting conditions of use, accuracy and sensitivity of measurement Energy dispersive spectroscopy (EDS), function of spectrometer and its basic characteristics, evaluating of the measured spectra, corrections, qualitative and quantitative analysis, limiting conditions of use, accuracy and sensitivity of measurement Auger electron spectroscopy (AES), principle of the method, formation of Auger electron, energy criteria, experimental device, area of use, accuracy, limiting conditions, specification for the quality of the analysed samples, use for analysis of surface layers X-ray fluorescent spectroscopy (XRF), principle of XRF spectrometer operation, analysing crystals, qualitative and quantitative analysis, evaluation of the measured spectra, correction methods, limiting conditions of use, accuracy and sensitivity of measurement Optical emission spectroscopy (OES, GDOES), theoretical analysis of optical emission spectroscopy, principle of optical emission spectrometer operation, methods of optical spectra detecting, interval concentrations measured, limiting conditions of use, accuracy and sensitivity of measurement. Secondary ion mass spectroscopy (SIMS), ion interaction with matter, type of mass spectrometers a description of their activities, the measurement of energy and angular distribution of secondary ions, magnetic and quadrupole ion detectors, evaluation of spectra, limiting conditions, sensitivity of method Other quantitative methods, quantitative measurement carbon and sulphure, quantitative measurement hydrogen, oxygen and nitrogen | |||||||||||||
| Recommended or required reading: | |||||||||||||
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| Language of instruction: | slovak or english | ||||||||||||
| Notes: | |||||||||||||
| Courses evaluation: | |||||||||||||
Assessed students in total: 119
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| Name of lecturer(s): | prof. Ing. Ľubomír Čaplovič, PhD. (examiner, instructor, lecturer, person responsible for course) - slovak prof. Ing. Mária Dománková, PhD. (examiner, instructor, lecturer) - slovak doc. Ing. Martin Kusý, PhD. (instructor) - slovak doc. Ing. Roman Moravčík, PhD. (instructor) - slovak Ing. Martin Sahul, PhD. (instructor) | ||||||||||||
| Last modification: | 20. 12. 2018 | ||||||||||||
| Supervisor: | prof. Ing. Ľubomír Čaplovič, PhD. and programme supervisor | ||||||||||||
Last modification made by Bc. Jana Rohaľová on 12/20/2018.