Feb 28, 2020   10:11 a.m. Zlatica
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Ing. Arpád Kósa, PhD.
Identification number: 50249
University e-mail: arpad.kosa [at] stuba.sk
 
Výskumný pracovník s VŠ vzdelaním - Institute of Electronics and Phototonics (FEEIT)

Contacts     Graduate     Lesson     Final thesis     
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The selected person is an author of the following publications.

Ord.PublicationsType of resultYearDetails
1.Čierny kremík pre fotovoltické aplikácie
Benko, Peter -- Drobný, Jakub -- Kósa, Arpád -- Harmatha, Ladislav -- Mikolášek, Miroslav -- Svitač, Erik -- Stuchlíková, Ľubica
Čierny kremík pre fotovoltické aplikácie. In Matematika, informační technologie a aplikované vědy. Brno: Univerzita obrany, 2019, ISBN 978-80-7582-097-6.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
2.Defect analysis of InAlGaN/GaN/SiC HEMT heterostructures
Stuchlíková, Ľubica -- Drobný, Jakub -- Kósa, Arpád -- Vadovský, Jakub -- Benko, Peter -- Škoda, Aurel -- Delage, Sylvain Laurent -- Kováč, Jaroslav
Defect analysis of InAlGaN/GaN/SiC HEMT heterostructures. In WOCSDICE 2019. Cabourg, 2019: 2019.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
3.Defect analysis of Ni-Au/AlN/p-Si MIS capacitors
Stuchlíková, Ľubica -- Drobný, Jakub -- Benko, Peter -- Kósa, Arpád -- Mikolášek, Miroslav -- Chvála, Aleš -- Marek, Juraj
Defect analysis of Ni-Au/AlN/p-Si MIS capacitors. In JANDURA, D. -- ŠUŠLIK, Ľ. -- URBANCOVÁ, P. -- KOVÁČ, J. ADEPT 2019. Žilina: University of Žilina, 2019, p. 223--226. ISBN 978-80-554-1568-0.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
4.Defect distribution in Fe - doped InP epitaxial layers
Kósa, Arpád -- Drobný, Jakub -- Kováč, Jaroslav -- Badura, M. -- Sciana, Beata -- Stuchlíková, Ľubica
Defect distribution in Fe - doped InP epitaxial layers. In JANDURA, D. -- ŠUŠLIK, Ľ. -- URBANCOVÁ, P. -- KOVÁČ, J. ADEPT 2019. Žilina: University of Žilina, 2019, p. 175--178. ISBN 978-80-554-1568-0.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
5.Defect distribution in metal-porous siliconsilicon structures
Benko, Peter -- Stuchlíková, Ľubica -- Kósa, Arpád -- Drobný, Jakub -- Harmatha, Ladislav -- Mikolášek, Miroslav -- Kopáni, M. -- Imamura, Kentaro -- Kobayashi, Hikaru -- Pinčík, Emil
Defect distribution in metal-porous siliconsilicon structures. In JANDURA, D. -- ŠUŠLIK, Ľ. -- URBANCOVÁ, P. -- KOVÁČ, J. ADEPT 2019. Žilina: University of Žilina, 2019, p. 135--138. ISBN 978-80-554-1568-0.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
6.Development of a virtual educational game about LEDs
Janecký, Dominik -- Kósa, Arpád
Vývoj virtuálnej edukačnej hry o LED diódach. Bachelor thesis. 2019. 45 p.
final thesis2019Details
7.Development of Virtual Education Game about Diodes
Maslen, Martin -- Kósa, Arpád
Vývoj virtuálnej edukačnej hry o diódach. Bachelor thesis. 2019. 31 p.
final thesis2019Details
8.DLTFS study of emission and capture processes in GaN/AlGaN/GaN/SiC HEMT heterostructures with different layer compositions
Drobný, Jakub -- Benko, Peter -- Kósa, Arpád -- Kopecký, Andrej -- Florovič, Martin -- Kováč, Jaroslav -- Delage, Sylvain Laurent -- Stuchlíková, Ľubica
DLTFS study of emission and capture processes in GaN/AlGaN/GaN/SiC HEMT heterostructures with different layer compositions. In WOCSDICE 2019. Cabourg, 2019: 2019.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
9.DLTFS study of GaN/AlGaN/GaN/SiC HEMT heterostructures with different layer composition
Drobný, Jakub -- Kopecký, Andrej -- Kósa, Arpád -- Benko, Peter -- Florovič, Martin -- Kováč, Jaroslav -- Delage, Sylvain Laurent -- Stuchlíková, Ľubica
DLTFS study of GaN/AlGaN/GaN/SiC HEMT heterostructures with different layer composition. In JANDURA, D. -- ŠUŠLIK, Ľ. -- URBANCOVÁ, P. -- KOVÁČ, J. ADEPT 2019. Žilina: University of Žilina, 2019, p. 111--114. ISBN 978-80-554-1568-0.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
10.DLTS study of defect distribution in metal-porous silicon-silicon structures for solar application
Harmatha, Ladislav -- Kósa, Arpád -- Drobný, Jakub -- Mikolášek, Miroslav -- Svitač, Erik -- Benko, Peter -- Greguš, Ján -- Bačová, Silvia -- Zitto, Peter -- Stuchlíková, Ľubica
DLTS study of defect distribution in metal-porous silicon-silicon structures for solar application. In SITEK, J. -- VAJDA, J. -- JAMNICKÝ, I. APCOM 2019. Melville: AIP Publishing, 2019, ISBN 978-0-7354-1873-8.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
11.DLTS study of electrically active defecta in power SiC MOSFET
Marek, Juraj -- Drobný, Jakub -- Kósa, Arpád -- Benko, Peter -- Stuchlíková, Ľubica
DLTS study of electrically active defecta in power SiC MOSFET. In SURFINT - SREN VI. Bratislava: Comenius University, 2019, p. 96--97. ISBN 978-80-223-4811-9.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
12.Electrical and DLTS characterization of AlN buffers for GaN on Si technology
Marek, Juraj -- Mikolášek, Miroslav -- Drobný, Jakub -- Zhao, Ming -- Stoffels, Steve -- Kósa, Arpád -- Benko, Peter -- Chvála, Aleš -- Bakeroot, Benoit -- Decoutere, Stefaan -- Stuchlíková, Ľubica
Electrical and DLTS characterization of AlN buffers for GaN on Si technology. In WOCSDICE 2019. Cabourg, 2019: 2019.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
13.Games in technical education
Stuchlíková, Ľubica -- Kósa, Arpád -- Benko, Peter -- Chymo, Filip -- Drobný, Jakub -- Hrbáček, Jiří
Games in technical education. In BAŠTINEC, J. -- HRUBÝ, M. Mathematics, Information Technologies and Applied Sciences 2019. Brno: University of Defence, 2019, p. 102--108. ISBN 978-80-7231-123-2.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
14.Identification of electrically active defects in modern structures based on gallium nitride
Drobný, Jakub -- Kósa, Arpád -- Weis, Martin -- Kováč, Jaroslav -- Stuchlíková, Ľubica
Identification of electrically active defects in modern structures based on gallium nitride. In BAŠTINEC, J. -- HRUBÝ, M. Mathematics, Information Technologies and Applied Sciences 2019. Brno: University of Defence, 2019, p. 50--58. ISBN 978-80-7231-123-2.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
15.Investigating the quality of the silicon and black silicon interface for photovoltaic applications
Benko, Peter -- Kósa, Arpád -- Drobný, Jakub -- Harmatha, Ladislav -- Mikolášek, Miroslav -- Stuchlíková, Ľubica
Investigating the quality of the silicon and black silicon interface for photovoltaic applications. In BAŠTINEC, J. -- HRUBÝ, M. Mathematics, Information Technologies and Applied Sciences 2019. Brno: University of Defence, 2019, p. 14--22. ISBN 978-80-7231-123-2.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
16.Investigation of electrically active defects in Fe-doped InP epitaxial layers
Kósa, Arpád -- Drobný, Jakub -- Kováč, Jaroslav -- Stuchlíková, Ľubica -- Bremond, Georges -- Badura, Mikolaj -- Ściana, Beata
Investigation of electrically active defects in Fe-doped InP epitaxial layers. In SURFINT - SREN VI. Bratislava: Comenius University, 2019, p. 1--2. ISBN 978-80-223-4811-9.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
17.Investigation of the Electrically Active Defects in the MOS Structure Based on Black Silicon
Svitač, Erik -- Kósa, Arpád
Skúmanie elektricky aktívnych porúch v MOS štruktúrach na báze čierneho kremíka. Diploma thesis. 2019. 61 p.
final thesis2019Details
18.Miesto edukačných hier v technickom vzdelávaní
Stuchlíková, Ľubica -- Benko, Peter -- Chymo, Filip -- Drobný, Jakub -- Kósa, Arpád -- Hrbáček, Jiří
Miesto edukačných hier v technickom vzdelávaní. In Matematika, informační technologie a aplikované vědy. Brno: Univerzita obrany, 2019, ISBN 978-80-7582-097-6.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
19.Reliability improvement of electrically active defect investigations by analytical and experimental deep level transient: Fourier spectroscopy investigations
Kósa, Arpád -- Sciana, Beata -- Stuchlíková, Ľubica
Reliability improvement of electrically active defect investigations by analytical and experimental deep level transient: Fourier spectroscopy investigations. Journal of Electrical Engineering, 70. p. 27--35.
articles in magazines2019Details
20.Study of emission and capture processes in Fe - doped INP epitaxial layers
Kósa, Arpád -- Drobný, Jakub -- Kováč, Jaroslav -- Badura, Mikolaj -- Ściana, Beata -- Stuchlíková, Ľubica
Study of emission and capture processes in Fe - doped INP epitaxial layers. In MICHALKA, M. -- VINCZE, A. 21. Škola vákuovej techniky. Bratislava: Slovenská vákuová spoločnosť, 2019, p. 136--139. ISBN 978-80-99905-01-7.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
21.The impact of AlGaN back barrier on the quality of the AlGaN/GaN HEMT heterostructures
Drobný, Jakub -- Kósa, Arpád -- Kováč, Jaroslav -- Stuchlíková, Ľubica
The impact of AlGaN back barrier on the quality of the AlGaN/GaN HEMT heterostructures. In MICHALKA, M. -- VINCZE, A. 21. Škola vákuovej techniky. Bratislava: Slovenská vákuová spoločnosť, 2019, p. 20--23. ISBN 978-80-99905-01-7.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
22.The impact of the different growth temperatures on the defect distribution in GaAsN/GaAs heterostructures
Ściana, Beata -- Chymo, Filip -- Drobný, Jakub -- Dawidowski, Wojciech -- Kósa, Arpád -- Mikolášek, Miroslav -- Stuchlíková, Ľubica
The impact of the different growth temperatures on the defect distribution in GaAsN/GaAs heterostructures. In MICHALKA, M. -- VINCZE, A. 21. Škola vákuovej techniky. Bratislava: Slovenská vákuová spoločnosť, 2019, p. 132--135. ISBN 978-80-99905-01-7.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
23.The influence of AIGaN back barrier on the defect distribution in the AIGaN/GaN HEMT structures
Drobný, Jakub -- Kósa, Arpád -- Benko, Peter -- Kováč, Jaroslav -- Bremond, Georges -- Delage, Sylvain Laurent -- Stuchlíková, Ľubica
The influence of AIGaN back barrier on the defect distribution in the AIGaN/GaN HEMT structures. In SURFINT - SREN VI. Bratislava: Comenius University, 2019, p. 1--2. ISBN 978-80-223-4811-9.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
24.The influence of the etching time formed nanostructured porous silicon on the defect distribution
Stuchlíková, Ľubica -- Kósa, Arpád -- Benko, Peter -- Mikolášek, Miroslav -- Harmatha, Ladislav -- Kobayashi, Hikaru -- Imamura, Kentaro -- Pinčík, Emil
The influence of the etching time formed nanostructured porous silicon on the defect distribution. In SURFINT - SREN VI. Bratislava: Comenius University, 2019, p. 161--162. ISBN 978-80-223-4811-9.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
25.Vizualization and processing of a large amount of measured DLTFS data in the evaluation process
Patlevičová, Ivana -- Kósa, Arpád -- Drobný, Jakub -- Michalko, Miroslav -- Jakab, František -- Stuchlíková, Ľubica
Vizualization and processing of a large amount of measured DLTFS data in the evaluation process. In JANDURA, D. -- ŠUŠLIK, Ľ. -- URBANCOVÁ, P. -- KOVÁČ, J. ADEPT 2019. Žilina: University of Žilina, 2019, p. 195--198. ISBN 978-80-554-1568-0.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details

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