Mar 29, 2020   11:47 a.m. Miroslav
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Ing. Peter Benko, PhD.
Identification number: 5148
University e-mail: peter.benko [at] stuba.sk
 
Výskumný pracovník s VŠ vzdelaním - Institute of Electronics and Phototonics (FEEIT)

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The selected person is an author of the following publications.

Ord.PublicationsType of resultYearDetails
1.A model of antiparallel spontaneous and piezoelectric polarizations in AlGaN/GaN
Racko, Juraj -- Mikolášek, Miroslav -- Grmanová, Alena -- Benko, Peter -- Kadlečíková, Magdaléna -- Harmatha, Ladislav -- Breza, Juraj
A model of antiparallel spontaneous and piezoelectric polarizations in AlGaN/GaN. In SITEK, J. -- VAJDA, J. -- JAMNICKÝ, I. APCOM 2019. Melville: AIP Publishing, 2019, ISBN 978-0-7354-1873-8.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
2.Čierny kremík pre fotovoltické aplikácie
Benko, Peter -- Drobný, Jakub -- Kósa, Arpád -- Harmatha, Ladislav -- Mikolášek, Miroslav -- Svitač, Erik -- Stuchlíková, Ľubica
Čierny kremík pre fotovoltické aplikácie. In Matematika, informační technologie a aplikované vědy. Brno: Univerzita obrany, 2019, ISBN 978-80-7582-097-6.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
3.Defect analysis of InAlGaN/GaN/SiC HEMT heterostructures
Stuchlíková, Ľubica -- Drobný, Jakub -- Kósa, Arpád -- Vadovský, Jakub -- Benko, Peter -- Škoda, Aurel -- Delage, Sylvain Laurent -- Kováč, Jaroslav
Defect analysis of InAlGaN/GaN/SiC HEMT heterostructures. In WOCSDICE 2019. Cabourg, 2019: 2019.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
4.Defect analysis of Ni-Au/AlN/p-Si MIS capacitors
Stuchlíková, Ľubica -- Drobný, Jakub -- Benko, Peter -- Kósa, Arpád -- Mikolášek, Miroslav -- Chvála, Aleš -- Marek, Juraj
Defect analysis of Ni-Au/AlN/p-Si MIS capacitors. In JANDURA, D. -- ŠUŠLIK, Ľ. -- URBANCOVÁ, P. -- KOVÁČ, J. ADEPT 2019. Žilina: University of Žilina, 2019, p. 223--226. ISBN 978-80-554-1568-0.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
5.Defect distribution in metal-porous siliconsilicon structures
Benko, Peter -- Stuchlíková, Ľubica -- Kósa, Arpád -- Drobný, Jakub -- Harmatha, Ladislav -- Mikolášek, Miroslav -- Kopáni, M. -- Imamura, Kentaro -- Kobayashi, Hikaru -- Pinčík, Emil
Defect distribution in metal-porous siliconsilicon structures. In JANDURA, D. -- ŠUŠLIK, Ľ. -- URBANCOVÁ, P. -- KOVÁČ, J. ADEPT 2019. Žilina: University of Žilina, 2019, p. 135--138. ISBN 978-80-554-1568-0.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
6.Design of Automated Testing Device for Power Integrated Circuits
Jonášek, Peter -- Benko, Peter
Návrh prostriedkov pre automatizované testovanie výkonových integrovaných obvodov. Diploma thesis. 2019. 84 p.
final thesis2019Details
7.DLTFS study of emission and capture processes in GaN/AlGaN/GaN/SiC HEMT heterostructures with different layer compositions
Drobný, Jakub -- Benko, Peter -- Kósa, Arpád -- Kopecký, Andrej -- Florovič, Martin -- Kováč, Jaroslav -- Delage, Sylvain Laurent -- Stuchlíková, Ľubica
DLTFS study of emission and capture processes in GaN/AlGaN/GaN/SiC HEMT heterostructures with different layer compositions. In WOCSDICE 2019. Cabourg, 2019: 2019.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
8.DLTFS study of GaN/AlGaN/GaN/SiC HEMT heterostructures with different layer composition
Drobný, Jakub -- Kopecký, Andrej -- Kósa, Arpád -- Benko, Peter -- Florovič, Martin -- Kováč, Jaroslav -- Delage, Sylvain Laurent -- Stuchlíková, Ľubica
DLTFS study of GaN/AlGaN/GaN/SiC HEMT heterostructures with different layer composition. In JANDURA, D. -- ŠUŠLIK, Ľ. -- URBANCOVÁ, P. -- KOVÁČ, J. ADEPT 2019. Žilina: University of Žilina, 2019, p. 111--114. ISBN 978-80-554-1568-0.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
9.DLTS study of defect distribution in metal-porous silicon-silicon structures for solar application
Harmatha, Ladislav -- Kósa, Arpád -- Drobný, Jakub -- Mikolášek, Miroslav -- Svitač, Erik -- Benko, Peter -- Greguš, Ján -- Bačová, Silvia -- Zitto, Peter -- Stuchlíková, Ľubica
DLTS study of defect distribution in metal-porous silicon-silicon structures for solar application. In SITEK, J. -- VAJDA, J. -- JAMNICKÝ, I. APCOM 2019. Melville: AIP Publishing, 2019, ISBN 978-0-7354-1873-8.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
10.DLTS study of electrically active defecta in power SiC MOSFET
Marek, Juraj -- Drobný, Jakub -- Kósa, Arpád -- Benko, Peter -- Stuchlíková, Ľubica
DLTS study of electrically active defecta in power SiC MOSFET. In SURFINT - SREN VI. Bratislava: Comenius University, 2019, p. 96--97. ISBN 978-80-223-4811-9.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
11.Electrical and DLTS characterization of AlN buffers for GaN on Si technology
Marek, Juraj -- Mikolášek, Miroslav -- Drobný, Jakub -- Zhao, Ming -- Stoffels, Steve -- Kósa, Arpád -- Benko, Peter -- Chvála, Aleš -- Bakeroot, Benoit -- Decoutere, Stefaan -- Stuchlíková, Ľubica
Electrical and DLTS characterization of AlN buffers for GaN on Si technology. In WOCSDICE 2019. Cabourg, 2019: 2019.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
12.Games in technical education
Stuchlíková, Ľubica -- Kósa, Arpád -- Benko, Peter -- Chymo, Filip -- Drobný, Jakub -- Hrbáček, Jiří
Games in technical education. In BAŠTINEC, J. -- HRUBÝ, M. Mathematics, Information Technologies and Applied Sciences 2019. Brno: University of Defence, 2019, p. 102--108. ISBN 978-80-7231-123-2.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
13.Charakterizácia porúch v moderných prvkoch a báze nitridu gália
Drobný, Jakub -- Weis, Martin -- Benko, Peter -- Kováč, Jaroslav -- Stuchlíková, Ľubica
Charakterizácia porúch v moderných prvkoch a báze nitridu gália. In Matematika, informační technologie a aplikované vědy. Brno: Univerzita obrany, 2019, ISBN 978-80-7582-097-6.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
14.Investigating the quality of the silicon and black silicon interface for photovoltaic applications
Benko, Peter -- Kósa, Arpád -- Drobný, Jakub -- Harmatha, Ladislav -- Mikolášek, Miroslav -- Stuchlíková, Ľubica
Investigating the quality of the silicon and black silicon interface for photovoltaic applications. In BAŠTINEC, J. -- HRUBÝ, M. Mathematics, Information Technologies and Applied Sciences 2019. Brno: University of Defence, 2019, p. 14--22. ISBN 978-80-7231-123-2.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
15.Miesto edukačných hier v technickom vzdelávaní
Stuchlíková, Ľubica -- Benko, Peter -- Chymo, Filip -- Drobný, Jakub -- Kósa, Arpád -- Hrbáček, Jiří
Miesto edukačných hier v technickom vzdelávaní. In Matematika, informační technologie a aplikované vědy. Brno: Univerzita obrany, 2019, ISBN 978-80-7582-097-6.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
16.The influence of AIGaN back barrier on the defect distribution in the AIGaN/GaN HEMT structures
Drobný, Jakub -- Kósa, Arpád -- Benko, Peter -- Kováč, Jaroslav -- Bremond, Georges -- Delage, Sylvain Laurent -- Stuchlíková, Ľubica
The influence of AIGaN back barrier on the defect distribution in the AIGaN/GaN HEMT structures. In SURFINT - SREN VI. Bratislava: Comenius University, 2019, p. 1--2. ISBN 978-80-223-4811-9.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
17.The influence of the etching time formed nanostructured porous silicon on the defect distribution
Stuchlíková, Ľubica -- Kósa, Arpád -- Benko, Peter -- Mikolášek, Miroslav -- Harmatha, Ladislav -- Kobayashi, Hikaru -- Imamura, Kentaro -- Pinčík, Emil
The influence of the etching time formed nanostructured porous silicon on the defect distribution. In SURFINT - SREN VI. Bratislava: Comenius University, 2019, p. 161--162. ISBN 978-80-223-4811-9.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
18.The influence of the etching time formed nanostructured porous silicon on the defect distribution in metal-porous silicon based structures
Chymo, Filip -- Drobný, Jakub -- Benko, Peter -- Mikolášek, Miroslav -- Harmatha, Ladislav -- Stuchlíková, Ľubica
The influence of the etching time formed nanostructured porous silicon on the defect distribution in metal-porous silicon based structures. In MICHALKA, M. -- VINCZE, A. 21. Škola vákuovej techniky. Bratislava: Slovenská vákuová spoločnosť, 2019, p. 128--131. ISBN 978-80-99905-01-7.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
19.Vertical current transport in thin MOS structures expressed via transport velocities
Racko, Juraj -- Mikolášek, Miroslav -- Benko, Peter -- Thiele, Sebastian -- Schwierz, Frank -- Breza, Juraj
Vertical current transport in thin MOS structures expressed via transport velocities. In SURFINT - SREN VI. Bratislava: Comenius University, 2019, p. 141--142. ISBN 978-80-223-4811-9.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details

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