Jan 19, 2020   2:12 a.m. Drahomíra, Mário, Sára
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Persons at STU


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Ing. Martin Vilhan
Identification number: 72668
University e-mail: martin.vilhan [at] stuba.sk
 
3971V00  Measurement Technology D-MT
FEEIT D-MT-UM den [year 2]
Doctoral type of study, full-time, attendance method form
UM-SAV, 2nd year of study

Contacts     Graduate     Final thesis     Publications     

The selected person is an author of the following publications.

Ord.PublicationsType of resultYearDetails
1.Measurement of the dynamic properties of fast semiconductor devices
Vilhan, Martin -- Šatka, Alexander
Meranie dynamických vlastností veľmi rýchlych polovodičových prvkov. Diploma thesis. 2018. 54 p.
final thesis2018Details
2.Measurement of the reverse recovery characteristics of p-n junction diodes by TDT and TDR methods
Vilhan, Martin -- Šatka, Alexander -- Priesol, Juraj
Measurement of the reverse recovery characteristics of p-n junction diodes by TDT and TDR methods. In JANDURA, D. -- ŠUŠLIK, Ľ. -- URBANCOVÁ, P. -- KOVÁČ, J. ADEPT 2019. Žilina: University of Žilina, 2019, p. 251--254. ISBN 978-80-554-1568-0.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details
3.Measuring Parameters of Electrical Impulses
Vilhan, Martin -- Šatka, Alexander
Meranie parametrov elektrických impulzov. Bachelor thesis. 2016. 43 p.
final thesis2016Details
4.Simulation analysis of InAlN/GaN monolithic NAND logic cell
Chvála, Aleš -- Nagy, Lukáš -- Marek, Juraj -- Priesol, Juraj -- Donoval, Daniel -- Vilhan, Martin -- Blaho, Michal -- Gregušová, Dagmar -- Kuzmík, Ján -- Šatka, Alexander
Simulation analysis of InAlN/GaN monolithic NAND logic cell. In BREZA, J. -- DONOVAL, D. -- VAVRINSKÝ, E. ASDAM 2018. Danvers: IEEE, 2018, p. 167--170. ISBN 978-1-5386-7488-8.
contributions in anthologies, chapters in monographs/textbooks, abstracts2018Details
5.TDR and TDT methods for measuring pulse characteristics of semiconductor devices
Vilhan, Martin -- Šatka, Alexander -- Priesol, Juraj
TDR and TDT methods for measuring pulse characteristics of semiconductor devices. In KOZÁKOVÁ, A. ELITECH´19. Bratislava: Vydavateľstvo Spektrum STU, 2019, ISBN 978-80-227-4915-2.
contributions in anthologies, chapters in monographs/textbooks, abstracts2019Details

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