Jun 21, 2019   0:07 a.m. Alojz
Academic information system

Summary of topics offered - Slovak university of technology in Bratislava


Basic information

Type of work: Dissertation thesis
Topic: Simulácia zobrazovania a manipulácie pomocou atomárneho silového mikroskopu
Title of topic in English: Simulation of imaging and manipulation with atomic force microscopy
State of topic: approved (prof. Ing. Julius Cirák, CSc. - Chairperson of Departmental Board)
Thesis supervisor: prof. Ing. Ivan Štich, DrSc.
Faculty: Faculty of Electrical Engineering and Information Technology
Supervising department: Institute of Nuclear and Physical Engineering - FEEIT
Max. no. of students: 1
Academic year:2019/2020
Proposed by: prof. Ing. Ivan Štich, DrSc.
External educational institution: Institute of Physics of the Slovak Academy of Sciences
Annotation: Projekt bude zameraný na SPM (surface probe microscopy) techník, a to obzvlášť na AFM, STM a KPFM (Kelvin Probe Force Microscopy). SPM techniky obvykle pre ich interpretáciu a plné pochopenie vyžadujú teoretickú interpretáciu/simulácie, čo bude úlohou doktoranda ako súčasť aktivít skupiny prof. Šticha v oblasti SPM na FÚ SAV [1, 2]. Projekt sa bude zameriavať najmä na iónové systémy ako napr. TiO2 povrchy a nabité defekty na nich, polaróny [2], ktoré plnia funkciu prirodzených zdrojov náboja. Náboj okrem toho budeme manipulovať aj KPFS technikami, ktoré nám umožnia manipulovať chemické väzby, náboj a spin atómov a molekúl na povrchu [2], najmä kyslíka a vodíka. Experimenty sa budú prevádzať u nášho partnera na Univerzite v Osake a simulácie sa budú robiť najmä metódami teórie hustotového funkcionálu na FÚ SAV. Úspešný doktorand bude v priamom kontakte s experimentom a navštívi nášho experimentálneho partnera v Osake. [1] Pozri napríklad, Y. Naitoh, R. Turanský, J. Brndiar, Y.J. Li, I. Štich, and Y. Sugawara,xNat. Phys. 13, 663 (2017); [2] Q. Zhang, Y.J. Li, H. F. Wen, Y. Adachi, M. Miyazaki, Y. Sugawara, R. Xu, Z. H. Cheng, J. Brndiar, L. Kantorovich, and I. Štich, J. Am. Chem. Soc. 140, 15668 (2018).
Annotation in English: The project will focus on SPM (surface probe microscopy) techniques, AFM, STM, and KPFM (Kelvin Probe Force Microscopy), in particular. These SPM techniques typically need theoretical/simulation support for their interpretation and full understanding, which the PhD. student will provide as a part of the SPM activities of Prof. Stich’s group at IP SAS [1, 2]. The project will mainly focus on strongly ionic systems, such as TiO2 surfaces and their charged defects, polarons [2], as natural sources of charge. In addition, the charge will be manipulated by KPFS techniques, thereby manipulating molecular bonds, charge, and spin of on-surface species [2], primarily oxygen and hydrogen. The experiments will be done at our partner, the Osaka University, and the simulations, mostly density functional theory, at IP SAS. A successful PhD. student will be in direct touch with the experiments by visiting our experimental partner in Osaka. [1] See, for instance, Y. Naitoh, R. Turanský, J. Brndiar, Y.J. Li, I. Štich, and Y. Sugawara, Nat. Phys. 13, 663 (2017); [2] Q. Zhang, Y.J. Li, H. F. Wen, Y. Adachi, M. Miyazaki, Y. Sugawara, R. Xu, Z. H. Cheng, J. Brndiar, L. Kantorovich, and I. Štich, J. Am. Chem. Soc. 140, 15668 (2018).



Limitations of the topic

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Limit to study programme
The table shows limitations of study programme, field, track the student has to be enrolled in to be able to register for a given topic.

ProgrammeTrackTrack
D-FYZ Physical Engineering-- not entered -- -- not entered --