STU Centre for Nanodiagnostics (UVP OUP REK) - list of publications
The application shows a list of professionals' publications of the selected department. The publication - department relationship can be modified by means of the My publications and their administration application. The Select department option is located in the section containing information on all kinds of publications, the Field of publication section in particular.
Number of entries found: 2
|Type of result|
A systematic study of MOCVD reactor conditions and Ga memory effect on properties of thick InAl(Ga)N layers: a complete depth-resolved investigation
Chauhan, Prerna -- Hasenöhrl, Stanislav -- Vančo, Ľubomír -- Šiffalovič, Peter -- Dobročka, Edmund -- Machajdík, Daniel -- Rosová, Alica -- Gucmann, Filip -- Kováč, Jaroslav -- Matko, Igor -- Kuball, Martin -- Kuzmík, Ján
A systematic study of MOCVD reactor conditions and Ga memory effect on properties of thick InAl(Ga)N layers: a complete depth-resolved investigation. CrystEngComm, 22. p. 130--141.
articles in magazines
|Properties of sputtered BaSi2 thin films annealed in vacuum condition|
Tian, Yilei -- Montes, Ana Rita -- Vančo, Ľubomír -- Isabella, Olindo -- Zeman, Miro
Properties of sputtered BaSi2 thin films annealed in vacuum condition. Japanese Journal of Applied Physics, 59. p. 2020.
|articles in magazines|