Development of methods for High Frequency Characterization of Advanced Electronic DevicesSupervisor: doc. Ing. Martin Tomáška, PhD.
This page shows details on the project. The primary projects are displayed together with a list of sub-projects.
|Project description:||Project handles customer needs in the field of on-wafer microwave devices measurement, characterization and modeling needed for microwave power measurement sensor|
|Kind of project:||VTP ()|
|Department:||Department of microelectronics (FEEIT)|
|Project status:||Successfully completed|
|Project start date :||01. 09. 2003|
|Project close date:||31. 08. 2006|
|Number of workers in the project:||1|
|Number of official workers in the project:||0|