May 22, 2019   11:09 p.m. Júlia, Juliana
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Development of methods for High Frequency Characterization of Advanced Electronic Devices

Supervisor: doc. Ing. Martin Tomáška, PhD.


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Project description:Project handles customer needs in the field of on-wafer microwave devices measurement, characterization and modeling needed for microwave power measurement sensor
Kind of project:VTP ()
Department:Department of microelectronics (FEEIT)
Project identification:AV/806/2002
Project status:Successfully completed
Project start date :01. 09. 2003
Project close date:31. 08. 2006
Number of workers in the project:1
Number of official workers in the project:0