Scanning Capacitance Microscope with High Sensitivity and Resolution, and Lateral Force Probe Control.Supervisor: doc. Ing. Ján Hribik, PhD.
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|Project description:||New solution of capacitance microscop will make use of a new principle of the microscope probe position control over the displayed and analyzed surfice and new solution of the input electronics which enables to reach optimal signal to noise ratio and a reduction of heat dissipation.|
|Kind of project:||VEGA ()|
|Department:||Department of radio and electronics (FEEIT)|
|Project status:||Successfully completed|
|Project start date :||01. 01. 2005|
|Project close date:||31. 12. 2007|
|Number of workers in the project:||2|
|Number of official workers in the project:||0|